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IEC TS 63297-2021 pdf Sensing devices for non-intrusive load monitoring , NILM ) systems

IEC standards 11-29
IEC TS 63297-2021 pdf Sensing devices for non-intrusive load monitoring , NILM ) systems

3.8 NILM system combination of a NILM sensing device and NILM analytics 3.9 power metering and monitoring device PMD combination in one or more devices of several functional modules dedicated to metering and monitoring electrical parameters in energy distribution systems or electrical installations, used for applications such as energy efficiency, power monitoring and network performance Note 1 to entry: Under the generic term “monitoring” are also included functions of recording, alarm management, etc. Note 2 to entry: PMDs have a known measurement uncertainty over a specified measurement range and are robust to influence quantities and industrial environments [SOURCE: IEC 61557-12:2018, 3.1.1, modified – Note 2 to entry has been modified and Note 3 to entry has been deleted] 3.10 power quality instrument instrument complying with IEC 62586-1 whose main function is to measure, record and possibly monitor power quality parameters in power supply systems, and whose measuring methods (class A or class S) are defined in IEC 61000-4-30 Note 1 to entry: PQIs have a known measurement uncertainty over a specified measurement range and are robust to influence quantities and industrial environments. They often also have transient event detection and waveform capture capabilities. [SOURCE: IEC 62586-1:2017, 3.1.1, modified – A reference to IEC 62586-1 and Note 1 to entry have been added]
In case an NSD is able to have several sampling frequencies, manufacturers should provide a class for each sampling frequency. In case an NSD is able to have several output data rates, manufacturers should provide a class for each output data rate. In case an NSD is able to have several data bit rates, manufacturers should provide a class for each data bit rate. For NSDs using information related to transient events, the data bit rate depends on the occurrence of the transient events, and the rate of occurrence used for classification shall be indicated. Annex A provides examples of NILM systems and examples of classification of NILM sensing devices. Annex B provides information about the calculation of the data bit rate.

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